2 article(s) from Ebeling, Daniel
Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case
- Babak Eslami,
- Daniel Ebeling and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 1144–1151, doi:10.3762/bjnano.5.125
Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case
- Daniel Ebeling and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20
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